InGaAs line scan camera


SWIR (short wavelength infrared) imaging is a great solution for non-destructive inspection. It sees under the surface, differentiates materials based on their SWIR spectral signatures, and offers a safe and convenient way to ensure product quality.

Example applications include checking liquid volumes in packages, inspecting contents of sealed containers, and detecting damages and contaminants in agricultural products. In addition, applications in the semiconductor industry include Si wafer pattern inspection and solar cell defect detection.Integrating SWIR imaging into production lines requires cameras such as the C15333-10E04 InGaAs line scan camera, whose high SWIR sensitivity and fast line rate are ideal for real time, in-line non-destructive inspection.

Compare to the conventional model, the C15333-10E04 has improved usability by adding an edge trigger function, which can shoot with a certain exposure time even the conveyor belt speed is changed while shooting. It also becomes compatible with a trigger enable function, which shoots only when an object is passing in front of the camera.


  • SWIR sensitivity from 950 nm to 1700 nm
  • 1024 pixel linear array
  • Maximum line rate: 40 kHz
  • Interface: Employs Gigabit Ethernet
  • Equipped with high quality images (Background subtraction, Real time shading correction)


  • Food and agricultural products (damage inspection, quality screening, material discrimination, etc.)
  • Semiconductors (Si wafer pattern inspection, solar cell inspection by EL/PL, etc.)
  • Industry (moisture content, leak detection, container inspection, etc.)


Our software provides the interface to access all of our carefully engineered camera features, from simply setting exposure to orchestrating complex triggering for multidimensional experiments.


Type number C15333-10E04
Imaging device InGaAs line sensor
Effective no. of pixels 1024 (H) × 1 (V)
Cell size 12.5 μm (H) × 12.5 μm (V)
Effective area 12.8 mm (H) × 0.0125 mm (V)
Readout speed Internal mode: 40 kHz (21 μs exposure time)
Edge trigger: 20 kHz (21 μs exposure time)
Sync readout: 40 kHz
Exposure time 21 μs to 1 s (1 μs step)
External trigger input Edge trigger, Sync readout
External trigger signal routing SMA or 12 pin HIROSE connector
Image processing functions Background subtraction, Real time shading correction
Interface Gigabit Ethernet
A/D converter 14 bit
Lens mount C mount
Power supply DC 12 V
Power consumption 6 W max.
Ambient operating temperature 0 ℃ to +40 ℃
Ambient storage temperature -10 ℃ to +50 ℃
Ambient operating humidity 30 % to 80 % (with no condensation)
Ambient storage humidity 90 % max. (with no condensation)

Spectral response


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